JEDEC JEP194
$118.00
Guideline for Gate Oxide Reliability and Robustness Evaluation Procedures for Silicon Carbide Power MOSFETs
This document provides guidelines for evaluating gate reliability and lifetime testing for silicon carbide (SiC) based power devices with a gate oxide or gate dielectric.
Related products
$23.00
$33.00
$70.00
$40.00
$27.00
$37.00
$25.00
$27.00