IEEE C62.59-2019
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IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in low-voltage systems. The technology types covered are: – Forward biased diodes – Zener breakdown diodes – Avalanche breakdown diodes – Punch-through diodes – Foldback diodes
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