IEEE 1149.1-2013

This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: Testing the interconnections between integrated circuits once they have been assembled onto a printed circuit board or other substrate – Testing the integrated circuit itself – Observing or modifying circuit activity during the componenta??s normal operation The test logic consists of a boundary-scan register and other building blocks and is accessed through a test access port (TAP).