IEC 63202-1 Ed. 1.0 b:2019
$25.00
Photovoltaic cells – Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
Related products
$43.00
$139.00
$47.00
$62.00
$41.00
$23.00