BS PD ISO/TR 21477:2017
$76.00
Optics and photonics. Preparation of drawings for optical elements and systems. Surface imperfection specification and measurement systems
BS PD ISO/TR 21477:2017 intends to guide the user to understand the origins, meanings and differences between the two systems of specifying and evaluating surface imperfections in ISO 10110-7 and ISO 14997, specifically the dimensional method and the visibility method, and to provide information on how to use them. Tables are provided to show specifications of roughly equivalent yield loss for imperfections in the two systems.
Cross References:
ISO 14997:2017
ISO 10110-7:2017
ISO 10110-1:2006
ISO 3
All current amendments available at time of purchase are included with the purchase of this document.
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