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ASTM F980-10e1 pdf

ASTM F980-10e1

$29.00

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

Category:
Standard By:ASTM International, 12/01/2010
Published:2010-12-01
Pages:7
File Size:1 file , 160 KB
Note:This product is unavailable in Russia, Ukraine, Belarus

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