JEDEC JESD28-1
$27.00
N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS
This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.
Related products
$24.00
$28.00
$27.00
$26.00
$29.00
$25.00
$33.00
$25.00