Describes the method of a typical oscilloscope waveform and the basic test circuit employed in the measurement of turn off loss for bipolar, IGBT and MOSFET power semiconductors. This method can be used as a standard for evaluating power semiconductor turn-off switching loss capability and defines standard terminology that should be referenced within the electronic industry.
JEDEC JESD 24-1 (R2002)
$26.00
ADDENDUM No. 1 to JESD24 – METHOD FOR MEASUREMENT OF POWER DEVICE TURN-OFF SWITCHING LOSS
Category: JEDEC