IEEE 1687-2014
$134.00
IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
This standard develops a methodology for access to embedded instrumentation, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and additional signals that may be required. The elements of the methodology include a description language for the characteristics of the features and for communication with the features, and requirements for interfacing to the features.
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