IEC 62951-2 Ed. 1.0 b:2019
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Semiconductor devices – Flexible and stretchable semiconductor devices – Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin°°°film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.
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