IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.
IEC 61788-15 Ed. 1.0 b:2011
$164.00
Superconductivity – Part 15: Electronic characteristic measurements – Intrinsic surface impedance of superconductor films at microwave frequencies