IEC 62373 Ed. 1.0 b:2006

Name: IEC 62373 Ed. 1.0 b:2006 - REALSTD
Price: 47.00 USD
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$47.00

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Category: IEC

Standard By:International Electrotechnical Commission, 07/18/2006

Published:2006-07-18

Pages:27

File Size:1 file , 530 KB

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Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)