ASTM F576-00

Name: ASTM F576-00 - REALSTD
Price: 29.00 USD
Availability: InStock

$29.00

Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry

Category: ASTM

Standard By:ASTM International, 01/01/2000

Published:2000-01-01

Pages:9

File Size:1 file , 280 KB

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Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry