BS PD IEC/TR 63133:2017
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Semiconductor devices. Scan based ageing level estimation for semiconductor devices
BS PD IEC/TR 63133:2017 specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
Cross References:
IEEE 1149.1:2013
All current amendments available at time of purchase are included with the purchase of this document.
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